General


History

The professorship for Radio Frequency Technology at the Helmut Schmidt University / University of the Federal Armed Forces Hamburg was established in April 1974 and headed by Prof. Dr.–Ing. H.G. Wäßerling until his retirement in March 1990. In October 1990, the leadership passed to Univ.-Prof. Dr.–Ing. habil. W. Platte. With this change, the professorship was rededicated to “Radio Frequency Technology and Optoelectronics”. After a short vacancy, the professorship was transferred to Prof. Dr.–Ing. C.G. Schäffer in July 2009 under its original denomination “Radio Frequency Technology”. Since his retirement in October 2021, PD Dr.–Ing. T. Fickenscher has been entrusted by the President with the official duties.

Equipment

High frequency and microwave equipment:

  • Vector network analysis up to 170 GHz
  • Spectrum analysis 100 Hz – 40 GHz and 60 – 170 GHz (harmonic mixer)
  • Digital time domain measurements up to 80 Gsamples/s
  • Bit error measurements up to 2*12.5 GBit/s
  • Generators and synthesizers up to 67 GHz and 75 GHz – 170 GHz at low and medium power
  • Antenna measurement technology
  • RF absorber cabin DC – 35 GHz, dimensions H x W x D: 2.35 m x 2.30 m x 3.50 m

Optoelectronic equipment:

  • Fiber optic measurement technology for components and integrated optical circuits
  • High resolution optical spectral analysis
  • NIR high power laser diodes up to 80 W cw, 120 W pulsed
  • Laser laboratory class IV

Simulation tools:

  • High Frequency Structure Simulator HFSS
  • CST Microwave Studio
  • EM Simulation Software FEKO
  • Advanced Design System ADS

Services Offered

  • Antenna Design
  • Antenna measurements
  • Coexistence of wind turbines with radio and radar systems
  • Simulation of electromagnetic field problems in radio frequency technology
  • System simulation & signal processing for SONAR/RADAR with synthetic aperture
  • Millimeter-wave passive circuits (interconnects, resonators, filters, antennas)
  • Characterization of microwave circuits up to 110 GHz
  • Non-destructive testing & material characterization
  • Optically controlled microwave and millimeter-wave components
HSU

Letzte Änderung: 12. January 2023